发明名称 Method of making an edge seal for a semiconductor device
摘要 An edge seal around the periphery of an integrated circuit device which environmentally protects the copper circuitry from cracks that may form in the low-k interlevel dielectric during dicing. The edge seal essentially constitutes a dielectric wall between the copper circuitry and the low-k interlevel dielectric near the periphery of the integrated circuit device. The dielectric wall is of a different material than the low-k interlevel dielectric.
申请公布号 US6734090(B2) 申请公布日期 2004.05.11
申请号 US20020078861 申请日期 2002.02.20
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 AGARWALA BIRENDRA N.;DALAL HORMAZDYAR MINOCHER;LINIGER ERIC G.;LLERA-HURLBURT DIANA;NGUYEN DU BINH;PROCTER RICHARD W.;RATHORE HAZARA SINGH;TIAN CHUNYAN E.;ENGEL BRETT H.
分类号 H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/768
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