Power supply device for a component testing installation

摘要

The invention relates to installations for testing components, particularly electronic chips having a permanently-increasing performance, especially in terms of current supported over long periods. In order to perform said tests correctly, the invention provides for a device that can deliver currents of up to and of the order of 200 A in a few microseconds. For this purpose, the device comprises a time-dependent power chopper (PWM) linked to a high-frequency linear amplifier (HFLA).