发明名称 Method of and computer program product for designing patterns, and method of manufacturing semiconductor device
摘要 A method of designing patterns has preparing a mask pattern used in a lithography process for transferring a circuit pattern intersecting with a step pattern on a substrate which has the step pattern designed thereon, and applying correction patterns to the mask pattern in accordance with correction rules considering a shape of the step pattern, the correction patterns being applied at intersections of edges of the circuit pattern and the step pattern and in the vicinity of the intersections.
申请公布号 US2004088675(A1) 申请公布日期 2004.05.06
申请号 US20030642266 申请日期 2003.08.18
申请人 NAKANO AYAKO;HASHIMOTO KOJI;SATO TAKASHI;SHIBATA TSUYOSHI;KOBAYASHI YUJI 发明人 NAKANO AYAKO;HASHIMOTO KOJI;SATO TAKASHI;SHIBATA TSUYOSHI;KOBAYASHI YUJI
分类号 G03F1/08;G03F1/14;G03F1/36;G03F1/68;G03F7/20;G06F17/50;H01L21/027;(IPC1-7):G06F17/50 主分类号 G03F1/08
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