发明名称 |
Method of and computer program product for designing patterns, and method of manufacturing semiconductor device |
摘要 |
A method of designing patterns has preparing a mask pattern used in a lithography process for transferring a circuit pattern intersecting with a step pattern on a substrate which has the step pattern designed thereon, and applying correction patterns to the mask pattern in accordance with correction rules considering a shape of the step pattern, the correction patterns being applied at intersections of edges of the circuit pattern and the step pattern and in the vicinity of the intersections. |
申请公布号 |
US2004088675(A1) |
申请公布日期 |
2004.05.06 |
申请号 |
US20030642266 |
申请日期 |
2003.08.18 |
申请人 |
NAKANO AYAKO;HASHIMOTO KOJI;SATO TAKASHI;SHIBATA TSUYOSHI;KOBAYASHI YUJI |
发明人 |
NAKANO AYAKO;HASHIMOTO KOJI;SATO TAKASHI;SHIBATA TSUYOSHI;KOBAYASHI YUJI |
分类号 |
G03F1/08;G03F1/14;G03F1/36;G03F1/68;G03F7/20;G06F17/50;H01L21/027;(IPC1-7):G06F17/50 |
主分类号 |
G03F1/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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