发明名称 Method of forming solid of a ferroelectric or high dielectric material and method of manufacturing semiconductor device employing the same
摘要 A method of forming a more satisfactory inorganic compound solid (ferroelectric film or the like) out of organic compound materials containing metal elements by annealing at a relatively low temperature. In order to form a ferroelectric film, a solution of organic compound materials containing metal elements is coated over a semiconductor substrate (S41) and dried (S42), after which precalcining is carried out (S43). After this process is repeated until a predetermined film thickness is achieved, organic substance removing treatment is carried out (S45). The organic substance removing treatment is carried out by, for example, heat treatment (approximately at 550° C.) in a low-pressure atmosphere (approximately at 50 Torr). Post calcining is carried out to inorganic compound materials obtained by the organic substance removing treatment (S46). The post calcining is carried out at a temperature of approximately 550° C., for example, whereby the inorganic compound materials are crystallized.
申请公布号 US6730522(B1) 申请公布日期 2004.05.04
申请号 US20010856818 申请日期 2001.05.25
申请人 ROHM CO., LTD. 发明人 NAKAMURA TAKASHI;FUJIMORI YOSHIKAZU
分类号 C01G1/02;C01G25/00;C01G35/00;C23C18/14;H01L21/02;H01L21/3105;H01L21/314;H01L21/316;(IPC1-7):H01L21/00 主分类号 C01G1/02
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