发明名称 MOSFET with decoupled halo before extension
摘要 An inverse-T transistor is formed by a method that decouples the halo implant, the deep S/D implant and the extension implant, so that the threshold voltage can be set by adjusting the halo implant without being affected by changes to the extension implant that are intended to alter the series resistance of the device. Formation of the inverse-T structure can be made by a damascene method in which a temporary layer deposited over the layer that will form the cross bar of the T has an aperture formed in it to hold the gate electrode, the aperture being lined with vertical sidewalls that provide space for the ledges that form the T. Another method of gate electrode formation starts with a layer of poly, forms a block for the gate electrode, covers the horizontal surfaces outside the gate with an etch-resistant material and etches horizontally to remove material above the cross bars on the T, the cross bars being protected by the etch resistant material.
申请公布号 US6730552(B1) 申请公布日期 2004.05.04
申请号 US20030604096 申请日期 2003.06.26
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 ABADEER WAGDI W.;BROWN JEFFREY S.;CHATTY KIRAN V.;GAUTHIER, JR. ROBERT J.;RADENS CARL J.;TONTI WILLIAM R.
分类号 H01L21/28;H01L21/336;H01L29/423;H01L29/78;(IPC1-7):H01L21/336 主分类号 H01L21/28
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