发明名称 SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING THE SAME, AND FIELD EFFECT TRANSISTOR, AND METHOD FOR MANUFACTURING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device with its parasitic capacitance reduced and resistance lowered. SOLUTION: The semiconductor device has a first conductivity type semiconductor substrate and roughly frustum-shape holes formed therein. On the semiconductor substrate, an opposite conductivity layer made of a second conductivity semiconductor which is opposite to the first conductivity semiconductor is formed. On the opposite conductivity layer, a filling layer is formed of a first conductivity semiconductor for filling up the holes. The hole may roughly be a truncated polyhedral pyramid or a truncated triangular pyramid. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004134537(A) 申请公布日期 2004.04.30
申请号 JP20020296735 申请日期 2002.10.09
申请人 ADVANTEST CORP 发明人 NAKAMURA AKITO
分类号 H01L29/80;(IPC1-7):H01L29/80 主分类号 H01L29/80
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