发明名称 |
SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING THE SAME, AND FIELD EFFECT TRANSISTOR, AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device with its parasitic capacitance reduced and resistance lowered. SOLUTION: The semiconductor device has a first conductivity type semiconductor substrate and roughly frustum-shape holes formed therein. On the semiconductor substrate, an opposite conductivity layer made of a second conductivity semiconductor which is opposite to the first conductivity semiconductor is formed. On the opposite conductivity layer, a filling layer is formed of a first conductivity semiconductor for filling up the holes. The hole may roughly be a truncated polyhedral pyramid or a truncated triangular pyramid. COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004134537(A) |
申请公布日期 |
2004.04.30 |
申请号 |
JP20020296735 |
申请日期 |
2002.10.09 |
申请人 |
ADVANTEST CORP |
发明人 |
NAKAMURA AKITO |
分类号 |
H01L29/80;(IPC1-7):H01L29/80 |
主分类号 |
H01L29/80 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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