发明名称 |
METHOD FOR DETERMINING BEAM SIZE OF ELECTRON EMISSION SOURCE TO DATA MEMORY MEDIUM |
摘要 |
PROBLEM TO BE SOLVED: To maintain the beam size of an electron emission source constant. SOLUTION: The method determines the beam size of the electron emission source for the purpose of the data memory medium (400). The electron emission source having an emission beam is moved to cross a conductor of a detector (402). The current flowing through the conductor due to the emission beam when the electron emission source moves across the detector is measured (404). The size of the emission beam of the electron emission source is determined in accordance with the position of the electron emission source and the measured current (406). COPYRIGHT: (C)2004,JPO
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申请公布号 |
JP2004134076(A) |
申请公布日期 |
2004.04.30 |
申请号 |
JP20030350472 |
申请日期 |
2003.10.09 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT CO LP |
发明人 |
VALLEY JEFFREY M;LIEBESKIND JOHN |
分类号 |
G11B9/10;G01J1/42;G11C7/00;G11C13/00;G11C13/04;(IPC1-7):G11B9/10 |
主分类号 |
G11B9/10 |
代理机构 |
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