发明名称 WAFER CLEANING APPARATUS
摘要 PURPOSE: A wafer cleaning apparatus is provided to be capable of easily controlling the concentration of a mixed solution of ozone water and HF. CONSTITUTION: A wafer cleaning apparatus(100) is provided with the first chemical unit(110) for storing the first chemical, the second chemical unit(120) for storing the second chemical, and a process chamber(140) for forming a mixed solution by using the first and second chemical supplied from the first and second chemical unit and cleaning the surface of a wafer using the mixed solution. The wafer cleaning apparatus further includes a concentration control part(130) between the chemical units and the process chamber. Preferably, a flow control valve is used as the concentration control part. Preferably, the first chemical is ozone water. Preferably, the second chemical is HF.
申请公布号 KR20040036288(A) 申请公布日期 2004.04.30
申请号 KR20020065252 申请日期 2002.10.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HUH, NO HYEON;HWANG, HA SEOP;HWANG, WAN GU;LEE, GI SEOK;SHIN, DONG MIN
分类号 H01L21/30;(IPC1-7):H01L21/30 主分类号 H01L21/30
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