发明名称 |
WAFER CLEANING APPARATUS |
摘要 |
PURPOSE: A wafer cleaning apparatus is provided to be capable of easily controlling the concentration of a mixed solution of ozone water and HF. CONSTITUTION: A wafer cleaning apparatus(100) is provided with the first chemical unit(110) for storing the first chemical, the second chemical unit(120) for storing the second chemical, and a process chamber(140) for forming a mixed solution by using the first and second chemical supplied from the first and second chemical unit and cleaning the surface of a wafer using the mixed solution. The wafer cleaning apparatus further includes a concentration control part(130) between the chemical units and the process chamber. Preferably, a flow control valve is used as the concentration control part. Preferably, the first chemical is ozone water. Preferably, the second chemical is HF.
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申请公布号 |
KR20040036288(A) |
申请公布日期 |
2004.04.30 |
申请号 |
KR20020065252 |
申请日期 |
2002.10.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HUH, NO HYEON;HWANG, HA SEOP;HWANG, WAN GU;LEE, GI SEOK;SHIN, DONG MIN |
分类号 |
H01L21/30;(IPC1-7):H01L21/30 |
主分类号 |
H01L21/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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