发明名称 Process and assembly for non-destructive surface inspections
摘要 A light beam is directed towards a surface along a direction normal to the surface. The surface is caused to move so that the beam scans the surface along a spiral path. An ellipsoidal mirror is placed with its axis along the surface normal to collect light scattered by the surface and any anomalies at the surface at collection angles away from the surface normal. In some applications, a lens arrangement with its axis along the surface normal is also used to collect the light scattered by the surface and any anomalies. The light scattered by the mirror and lenses may be directed to the same or different detectors. Preferably light scattered by the surface within a first range of collection angles from the axis is detected by a first detector and light scattered by the surface within a second range of collection angles from the axis is detected by a second detector. The two ranges of collection angles are different, with one detector optimized to detect scattering from large particles and defects and the other detector optimized to detect light from small particles and defects.
申请公布号 US2004080741(A1) 申请公布日期 2004.04.29
申请号 US20030619109 申请日期 2003.07.10
申请人 发明人 MARXER NORBERT;GROSS KENNETH P.;ALTENDORFER HUBERT;KREN GEORGE
分类号 G01N21/94;G01N21/95;(IPC1-7):G01N21/00 主分类号 G01N21/94
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