发明名称 |
System for measurement of absorbed doses of electron beams in an irradiated object |
摘要 |
A method and apparatus for measuring doses of electron beams that are absorbed by an object subjected to e-beam irradiation. The absorbed dose can be continuously measured during an irradiation process, and adjustment can be made to system parameters in accordance with the measured absorbed dose.
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申请公布号 |
US2004079900(A1) |
申请公布日期 |
2004.04.29 |
申请号 |
US20020279419 |
申请日期 |
2002.10.24 |
申请人 |
STERIS INC. |
发明人 |
KORENEV SERGEY A.;KORENEV IVAN S. |
分类号 |
G21K5/10;(IPC1-7):G21K5/10;H01J37/244 |
主分类号 |
G21K5/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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