发明名称 |
System and method of measuring low impedances |
摘要 |
<p>Several sets of voltage measurement are obtained with respect to a periodic current waveform, generated by a pair of current levels. A clock frequency-dependent noise is determined from a Fourier component of the averaged measurements. A filtered average voltage is generated by removing the noise, whose Fourier component is divided by Fourier component of periodic current waveform to determine an impedance. Independent claims are also included for the following: (1) impedance determination method; and (2) impedance measurement system.</p> |
申请公布号 |
EP1413891(A1) |
申请公布日期 |
2004.04.28 |
申请号 |
EP20030256572 |
申请日期 |
2003.10.17 |
申请人 |
HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. |
发明人 |
KANTOROVICH, ISAAC;ROOT, STEPHEN C.;HOUGHTON, CHRISTOPHER L.;ST. LAURENT, JAMES J. |
分类号 |
G01R27/02;G01R27/08;G01R27/20;G01R31/30;G06F11/24;(IPC1-7):G01R27/20;G01R31/316 |
主分类号 |
G01R27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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