发明名称 Semiconductor circuit extraction apparatus and method
摘要 A semiconductor circuit extraction apparatus: detects the uppermost wiring layer of a cell; carries out virtual wiring conductor routing on all tracks of a cell-top wiring layer directly overlying the uppermost wiring layer of the cell; extracts parasitic capacitances of all the wiring conductors including those virtually routed; and calculates the delay time of placement/routing data in accordance with the extracted parasitic capacitances to provide highly accurate delay information library data.
申请公布号 US6728943(B2) 申请公布日期 2004.04.27
申请号 US20010848209 申请日期 2001.05.04
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 KANAMOTO TOSHIKI
分类号 G06F17/50;H01L21/768;H01L21/82;H01L21/822;H01L23/522;H01L27/04;(IPC1-7):G06F17/50;G06F9/45 主分类号 G06F17/50
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