发明名称 |
Semiconductor circuit extraction apparatus and method |
摘要 |
A semiconductor circuit extraction apparatus: detects the uppermost wiring layer of a cell; carries out virtual wiring conductor routing on all tracks of a cell-top wiring layer directly overlying the uppermost wiring layer of the cell; extracts parasitic capacitances of all the wiring conductors including those virtually routed; and calculates the delay time of placement/routing data in accordance with the extracted parasitic capacitances to provide highly accurate delay information library data.
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申请公布号 |
US6728943(B2) |
申请公布日期 |
2004.04.27 |
申请号 |
US20010848209 |
申请日期 |
2001.05.04 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
KANAMOTO TOSHIKI |
分类号 |
G06F17/50;H01L21/768;H01L21/82;H01L21/822;H01L23/522;H01L27/04;(IPC1-7):G06F17/50;G06F9/45 |
主分类号 |
G06F17/50 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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