发明名称 |
Apparatus and method for pattern exposure and method for adjusting the apparatus |
摘要 |
A method for performing optical adjustments of an exposure apparatus is based on an exposure apparatus having a light source for generating illumination light for exposure, and illumination optics for irradiating a mask with the illumination light generated from the exposure light source so as to imprint a mask pattern on a substrate base. The apparatus uses a wide bandwidth light source for the exposure light source that produces exposure light and non-exposure light having wavelengths different from those in the exposure light, and optical adjustments for optical components in at least a portion of the illumination optics are performed by using non-exposure light
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申请公布号 |
US6727980(B2) |
申请公布日期 |
2004.04.27 |
申请号 |
US20010846304 |
申请日期 |
2001.05.02 |
申请人 |
NIKON CORPORATION |
发明人 |
OTA KAZUYA;TANIMOTO AKIKAZU;HAGIWARA TSUNEYUKI;KOMATSUDA HIDEKI;MORI TAKASHI |
分类号 |
G03F7/20;(IPC1-7):G03B27/52;G03B27/42;G03B27/32;G02B17/00;G03C5/00 |
主分类号 |
G03F7/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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