发明名称 Apparatus and method for pattern exposure and method for adjusting the apparatus
摘要 A method for performing optical adjustments of an exposure apparatus is based on an exposure apparatus having a light source for generating illumination light for exposure, and illumination optics for irradiating a mask with the illumination light generated from the exposure light source so as to imprint a mask pattern on a substrate base. The apparatus uses a wide bandwidth light source for the exposure light source that produces exposure light and non-exposure light having wavelengths different from those in the exposure light, and optical adjustments for optical components in at least a portion of the illumination optics are performed by using non-exposure light
申请公布号 US6727980(B2) 申请公布日期 2004.04.27
申请号 US20010846304 申请日期 2001.05.02
申请人 NIKON CORPORATION 发明人 OTA KAZUYA;TANIMOTO AKIKAZU;HAGIWARA TSUNEYUKI;KOMATSUDA HIDEKI;MORI TAKASHI
分类号 G03F7/20;(IPC1-7):G03B27/52;G03B27/42;G03B27/32;G02B17/00;G03C5/00 主分类号 G03F7/20
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