| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a substrate acceptability evaluation method wherein acceptability of a substrate is determined without providing a mark or a region on the substrate exclusively for acceptability evaluation, and wherein the substrate is reduced in size for saving the space. <P>SOLUTION: In this substrate acceptability evaluation method, acceptability of a substrate 1 is determined by sensing the object item on the substrate 1 and by checking it for its shape, presence/absence, or the like. Not a mark on the substrate 1 provided exclusively for evaluation is the object of evaluation, but an IC device 2, an electronic component 3, or the like, is the object of evaluation, which is mounted on the substrate 1 only when the object is acceptable in quality. The substrate 1 is determined to be acceptable when the evaluation object is in place on the substrate 1. <P>COPYRIGHT: (C)2004,JPO |
