发明名称 Capacitor and fabrication method thereof
摘要 A fabrication of a capacitor in a semiconductor is simplified by using nitrogen plasma in forming an aluminum nitride layer functioning as an insulation layer on the aluminum layer disposed in a capacitor region. Subsequently, a planarized IMD (inter-metal dielectric) layer is obtained, facilitating via etching process.
申请公布号 US2004077141(A1) 申请公布日期 2004.04.22
申请号 US20020327991 申请日期 2002.12.26
申请人 ANAM SEMICONDUCTOR, INC. 发明人 KIM JUNG-JOO
分类号 H01L23/52;H01L21/02;H01L21/318;H01L21/3205;H01L21/822;H01L21/8242;H01L27/04;H01L27/108;(IPC1-7):H01L21/824;H01L21/302;H01L21/461 主分类号 H01L23/52
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