发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a nonvolatile semiconductor memory device that can reduce the variations of the erasing or writing thresholds. <P>SOLUTION: This nonvolatile semiconductor memory device has several nonvolatile memory cells connected in series and capable of electrical rewriting, and a selective gate transistors series connected to the series connected memory cells. The memory cells neighboring the selective gate transistor are dummy cells not used for storing the data and biased to the same voltage as the other memory cells when erasing the data. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004127346(A) 申请公布日期 2004.04.22
申请号 JP20020286055 申请日期 2002.09.30
申请人 TOSHIBA CORP 发明人 HAZAMA HIROAKI;OTANI NORIO
分类号 G11C16/02;G11C16/04;G11C16/10;G11C16/14;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):G11C16/04;H01L21/824 主分类号 G11C16/02
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