发明名称 APPEARANCE EXAMINING METHOD AND DEVICE FOR ELECTRONIC CIRCUIT COMPONENT AND METHOD OF MANUFACTURING ELECTRONIC CIRCUIT COMPONENT
摘要 <P>PROBLEM TO BE SOLVED: To improve the accuracy in processing by using the color image processing, in the examination of the appearance of an electronic circuit component. <P>SOLUTION: The examined face color information composed of three coordinate components of a three-dimensional color space coordinate system in each position of an examined face, is created by an image processing device 11 on the basis of a detection output signal indicating the color image information of the electronic circuit component, picked up by a color light receiving part 2, the first image procession data composed of at least one coordinate component of at least one of the first examined face data indicating the examined face color information and the second examined face data of which the coordinate is converted into the three-dimensional color space coordinate system different from the first examination face data, a dimension of each coordinate component of the first image procession data is corrected by using the nondefective unit reference color data on the basis of the predetermined nondefective reference color information, a result of the processing is stored in a memory 14 as the corrected image procession data, and the image processing is performed by using the corrected image procession data and the nondefective reference color data to select a defective area of the examined face. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004125434(A) 申请公布日期 2004.04.22
申请号 JP20020286053 申请日期 2002.09.30
申请人 NGK SPARK PLUG CO LTD 发明人 TSUNEKAWA TOMOYOSHI;NAKAMURA SHINYA
分类号 G01N21/956;G06T1/00 主分类号 G01N21/956
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