发明名称 Aberration corrector for instrument utilizing charged-particle beam
摘要 An aberration corrector comprises four stages of electrostatic quadrupole elements, two stages of electrostatic quadrupole elements for superimposing a magnetic potential distribution analogous to the electric potential distribution created by the two central ones of the four stages of the electrostatic quadrupole elements on the electric potential distribution, an objective lens, a manual operation portion permitting a user to modify the accelerating voltage or the working distance, a power supply for supplying voltages to the four stages of electrostatic quadrupole elements, a power supply for exciting the two stages of magnetic quadrupole elements, a power supply for the objective lens, and a control portion for controlling the power supplies according to a manual operation or setting performed on the manual operation portion.
申请公布号 US6723997(B2) 申请公布日期 2004.04.20
申请号 US20020281378 申请日期 2002.10.25
申请人 JEOL LTD. 发明人 MATSUYA MIYUKI;HONDA KAZUHIRO
分类号 G01N23/225;G01Q30/06;G21K1/087;(IPC1-7):H01J3/14;H01J37/26 主分类号 G01N23/225
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