发明名称 SEMICONDUCTOR WAFER PROCESSING APPARATUS FOR EASILY CHECKING THE NUMBER OF LOST WAFER AND SEMICONDUCTOR WAFER TREATMENT PROCESS USING THE SAME
摘要 PURPOSE: A semiconductor wafer processing apparatus for easily checking the number of lost wafer and a semiconductor wafer treatment process using the same are provided to be capable of preventing the semiconductor wafers from being lost without the recognition of a user. CONSTITUTION: A semiconductor wafer processing apparatus is provided with a loading/unloading part for loading and unloading a plurality of semiconductor wafers, and a wafer processing part for performing a predetermined treatment process on a semiconductor wafer transferred from the loading/unloading part and transferring the wafer to the loading/unloading part. The semiconductor wafer processing equipment further includes a sensor(410) for checking the first number of the semiconductor wafers loaded to the loading/unloading part and the second number of the semiconductor wafers unloaded from the loading/unloading part, a control part(420) for comparing the first number to the second number and outputting a resultant signal of the comparison, and a display part(430) for outputting the comparison result according to the signal supplied from the control part.
申请公布号 KR20040032689(A) 申请公布日期 2004.04.17
申请号 KR20020061921 申请日期 2002.10.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 JUNG, WON SEOK
分类号 H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/00
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