发明名称 |
SEMICONDUCTOR WAFER PROCESSING APPARATUS FOR EASILY CHECKING THE NUMBER OF LOST WAFER AND SEMICONDUCTOR WAFER TREATMENT PROCESS USING THE SAME |
摘要 |
PURPOSE: A semiconductor wafer processing apparatus for easily checking the number of lost wafer and a semiconductor wafer treatment process using the same are provided to be capable of preventing the semiconductor wafers from being lost without the recognition of a user. CONSTITUTION: A semiconductor wafer processing apparatus is provided with a loading/unloading part for loading and unloading a plurality of semiconductor wafers, and a wafer processing part for performing a predetermined treatment process on a semiconductor wafer transferred from the loading/unloading part and transferring the wafer to the loading/unloading part. The semiconductor wafer processing equipment further includes a sensor(410) for checking the first number of the semiconductor wafers loaded to the loading/unloading part and the second number of the semiconductor wafers unloaded from the loading/unloading part, a control part(420) for comparing the first number to the second number and outputting a resultant signal of the comparison, and a display part(430) for outputting the comparison result according to the signal supplied from the control part.
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申请公布号 |
KR20040032689(A) |
申请公布日期 |
2004.04.17 |
申请号 |
KR20020061921 |
申请日期 |
2002.10.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JUNG, WON SEOK |
分类号 |
H01L21/00;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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