发明名称 Process for semiconductor device fabrication in which a insulating layer is formed on a semiconductor substrate
摘要 The present invention provides a method for manufacturing a semiconductor device comprising a III-V semiconductor substrate, and an insulating layer deposited on the substrate by Atomic Layer Deposition (ALD). The use of ALD to deposit the insulating layer was found to facilitate the creation of active devices that avoid Fermi layer pinning. In addition, such insulating layer may be advantageously used as a passivation layer in III-V substrate based active devices and transistors.
申请公布号 US2004067660(A1) 申请公布日期 2004.04.08
申请号 US20020263638 申请日期 2002.10.03
申请人 AGERE SYSTEMS, INC. 发明人 WILK GLEN DAVID;YE PEIDE
分类号 H01L21/28;H01L21/316;H01L21/338;H01L29/51;H01L29/78;H01L29/812;(IPC1-7):H01L21/823 主分类号 H01L21/28
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