发明名称 INSPECTION METHOD AND INSPECTION DEVICE OF PRINTED MATTER
摘要 <P>PROBLEM TO BE SOLVED: To provide an inspection method and an inspection device capable of reducing an influence of position deviation or warping at the conveyance time of a printed matter, and detecting an abnormal part highly accurately. <P>SOLUTION: This inspection device 100 is equipped with an imaging device 1 for imaging the printed matter P surface and an image processing device 2 for applying image processing to an imaged image by the imaging device 1. The image processing device 2 is equipped with a minimum value filter means 202 for applying a minimum value filter to the imaged image of the normal printed matter P surface, a concentration addition means 203 for adding a prescribed concentration value and producing a reference image, a differential processing means 210 for producing a differential image by subtracting the imaged image of the printed matter P surface which is an inspection object from the reference image, a padding processing means 212 for applying padding processing to the differential image, an edge detection filter means 219 for applying also an edge detection filter, and a binarization means 220 for performing binarization by a prescribed threshold and detecting the abnormal part. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004109047(A) 申请公布日期 2004.04.08
申请号 JP20020275115 申请日期 2002.09.20
申请人 NITTO DENKO CORP 发明人 SHIKAMI MASAKI;TORIDA HIROBUMI
分类号 B41F33/14;G01N21/88;G01N21/892;G06T1/00;G06T5/00;G06T5/50;G06T7/00 主分类号 B41F33/14
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