| 摘要 |
An apparatus, program product, and method for estimating the stress intensity factor ratio (SIFR) of a material. The material is supported on a support and a load is applied to the material using a load member. A pair of strain components are measured using a strain gage attached to the material, and are stored in memory. The strain gage may be a rosette strain gage, for example. A processor calculates a ratio of the stored pair of strain components to thereby provide an estimate of the SIFR of the material. Advantageously, this estimate of the SIFR of the material is readily provided. Also advantageously, the estimate may be provided in a manner that is non-destructive to the material. The processor may additionally calculate the stress level of the material based on the estimated SIFR.
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