发明名称 SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING THE SAME, ACTIVE MATRIX SUBSTRATE AND ELECTRO-OPTICAL DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method of a semiconductor device which can sufficiently activate impurities by thermal treatment without giving damage of heat to a substrate and the like, when the different impurities are implanted to a semiconductor film and they are thermally treated. <P>SOLUTION: The manufacturing method of the semiconductor device comprises a process for forming a semiconductor layer 5 on a substrate 1, a process for forming a gate insulating layer 6 on the semiconductor layer 5, a process for forming gate electrodes 13, 14 and 15 on the gate insulating layer 6, a process for implanting two or above types of the impurities to the semiconductor layer 5, and a process for activating the impurities. The impurity activating process comprises a high temperature short time thermal treatment process for performing thermal treatment in a short time at a relatively high temperature, and a low temperature long time thermal treatment process for performing thermal treatment for a long time at a relatively low temperature. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004103841(A) 申请公布日期 2004.04.02
申请号 JP20020264003 申请日期 2002.09.10
申请人 SEIKO EPSON CORP 发明人 ITO ATSUSHI
分类号 G02F1/1368;H01L21/20;H01L21/265;H01L21/324;H01L21/336;H01L29/786;(IPC1-7):H01L21/336;G02F1/136 主分类号 G02F1/1368
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