| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a failure analysis system for a logic LSI and a failure analysis method, which properly reproduce the failure, and which facilitate the analysis on the relevance of the true failure to the detected failure. <P>SOLUTION: The failure analysis system for the logic LSI having built-in software includes a function for recording terminal signal information of the logic LSI in synchronization with a clock, a function for reproducing the recorded terminal signal information in synchronization with the clock, a function for comparing the reproduced terminal signal information with terminal signal information of a normal logic LSI, and a function for generating a trace differential map between a trace data map for the logic LSI to be analyzed and a trace data map of the normal logic LSI. <P>COPYRIGHT: (C)2004,JPO |
