发明名称 Fiber optic wafer probe for measuring the parameters of photodetectors and other optoelectronic devices in situ on a wafer, whereby the probe has a probe body with a tip from which an optical fiber extends towards a test object
摘要 <p>Fiber optic probe comprises a probe body with a tip that is selectively brought up to a device to be tested and an elongated optical fiber that extends along the body of the probe and projects beyond its tip. The size of the probe body is such that the optical fiber is held within the body so that is not free to move. Independent claims are also included for a number of fiber optic probe adaptations.</p>
申请公布号 DE20220754(U1) 申请公布日期 2004.04.01
申请号 DE2002220754U 申请日期 2002.05.03
申请人 CASCADE MICROTECH, INC. 发明人
分类号 G02B6/36;G02B6/38;G02B6/42;(IPC1-7):G01M11/00 主分类号 G02B6/36
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