发明名称 Method of fabricating a gate structure of a field effect transistor using a hard mask
摘要 A method of fabricating a gate structure of a field effect transistor, comprising forming a hard mask, etching a gate electrode, and contemporaneously forming a gate dielectric and removing the hard mask.
申请公布号 US2004053484(A1) 申请公布日期 2004.03.18
申请号 US20020245130 申请日期 2002.09.16
申请人 APPLIED MATERIALS, INC. 发明人 KUMAR AJAY;NALLAN PADMAPANI C.
分类号 H01L21/28;H01L21/311;H01L21/3213;H01L21/336;(IPC1-7):H01L21/320;H01L21/476 主分类号 H01L21/28
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