发明名称 THERMAL ANALYSIS APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a thermal analysis apparatus that can improve data matching properties between a thermomechanical analysis and a thermogravimetric analysis and can improve reliability to a thermal analysis. SOLUTION: The thermal analysis apparatus comprises a heat treatment furnace 2 having a heating control section 3 for heat-treating a sample based on a specific temperature and an atmospheric program; a thermomechanical analysis section 4 for measuring the mechanical characteristics of the sample as a function of temperature or time; a thermogravimetric analysis section 5 for measuring a weight change in the sample as a function of temperature or time; and a CPU (recording section) 10 for simultaneously and continuously recording data at the thermomechanical analysis section 4 and data at the thermogravimetric analysis section 5. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004085224(A) 申请公布日期 2004.03.18
申请号 JP20020242947 申请日期 2002.08.23
申请人 MURATA MFG CO LTD 发明人 KARIYA SATOSHI;HIRATA YOSUKE;INAOKA MASATO;AKIMOTO SHIGERU
分类号 G01N5/04;(IPC1-7):G01N5/04 主分类号 G01N5/04
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