发明名称 |
THERMAL ANALYSIS APPARATUS |
摘要 |
PROBLEM TO BE SOLVED: To provide a thermal analysis apparatus that can improve data matching properties between a thermomechanical analysis and a thermogravimetric analysis and can improve reliability to a thermal analysis. SOLUTION: The thermal analysis apparatus comprises a heat treatment furnace 2 having a heating control section 3 for heat-treating a sample based on a specific temperature and an atmospheric program; a thermomechanical analysis section 4 for measuring the mechanical characteristics of the sample as a function of temperature or time; a thermogravimetric analysis section 5 for measuring a weight change in the sample as a function of temperature or time; and a CPU (recording section) 10 for simultaneously and continuously recording data at the thermomechanical analysis section 4 and data at the thermogravimetric analysis section 5. COPYRIGHT: (C)2004,JPO
|
申请公布号 |
JP2004085224(A) |
申请公布日期 |
2004.03.18 |
申请号 |
JP20020242947 |
申请日期 |
2002.08.23 |
申请人 |
MURATA MFG CO LTD |
发明人 |
KARIYA SATOSHI;HIRATA YOSUKE;INAOKA MASATO;AKIMOTO SHIGERU |
分类号 |
G01N5/04;(IPC1-7):G01N5/04 |
主分类号 |
G01N5/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|