发明名称 TERAHERTZ PULSE LIGHT MEASURING DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To perform the real-time measurement of the time series waveform of field intensity of a terahertz pulse light extending over all portions of the two-dimensional area of an object. <P>SOLUTION: An antenna 76 collectively radiates the terahertz pulse light to the two-dimensional area of a specimen 100, and the two-dimensional area of an electrochemical crystal 81 collectively receives the transmitted pulse light. A probe pulse light chirped and synchronized to a pulse light L75 is collectively radiated to the two-dimensional area of the crystal 81. An analyzer 86 extracts a specified poralization component of the probe pulse light passed through the crystal 81 and changed in polarization state by a pulse light L55. A plurality of spectrometers 89 divides the probe pulse light from which only the specified polarization component is extracted so as to correspond to each portion of the two-dimensional area of the crystal 81 to obtain the intensity of each wavelength component. An optical fiber bundle 88 guides the probe pulse light from which only the specified polarization component is extracted to the spectrometers 89. <P>COPYRIGHT: (C)2004,JPO</p>
申请公布号 JP2004085358(A) 申请公布日期 2004.03.18
申请号 JP20020246788 申请日期 2002.08.27
申请人 TOCHIGI NIKON CORP;NIKON CORP 发明人 IWAMOTO TOSHIYUKI
分类号 G01J3/36;G01J3/42;G01J3/447;G01N21/21;G01N21/35;G01N21/3563;G01N21/3586;H01S3/00;(IPC1-7):G01N21/35 主分类号 G01J3/36
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