发明名称 PROCESS FOR FORMING SILICON NANOCRYSTAL STRUCTURE TERMINATING IN OXYGEN OR NITROGEN AND THE SILICON NANOCRYSTAL STRUCTURE FORMED THROUGH THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To easily and inexpensively form a silicon nanocrystal structure terminating in oxygen or nitrogen which can be formed on a silicon substrate employing a process for manufacturing a silicon integral circuit and shows a high luminous efficiency wherein particle size of the silicon nanocrystals can be controlled to an accuracy of 1-2 nm and density per unit area can be increased by surely terminating the surface of the formed structure by oxygen or nitrogen. <P>SOLUTION: In a process for forming the silicon nanocrystal structure, a nanometer-thick silicon thin film comprising silicon crystallites and amorphous silicon is formed on the substrate by heating the substrate to a predetermined temperature in a plasma-treatment chamber, controlling the atmosphere inside the chamber to achieve a vacuum atmosphere containing at least a hydrogenated silicon gas and a hydrogen gas and applying a high-frequency electric field. Then, the silicon thin film is subjected to plasma oxidation or plasma nitriding treatment by discontinuing the application of the high-frequency electric field, replacing the atmosphere inside the chamber with an oxidizing or nitriding gas atmosphere and resuming the application of the high-frequency electric field. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004083299(A) 申请公布日期 2004.03.18
申请号 JP20020243342 申请日期 2002.08.23
申请人 ANELVA CORP 发明人 NUMAZAWA YOICHIRO;MURAO YUKINOBU
分类号 C01B33/02;B82B3/00;C09K11/02;C09K11/08;C09K11/59;C23C16/24;C23C16/56;H01L33/16;H01L33/34 主分类号 C01B33/02
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