发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of high output operation at a high frequency band with a small drain capacitance. SOLUTION: This semiconductor device comprises a semiconductor substrate, a gate electrode 3 arranged on the semiconductor substrate through an insulating film, a drain region in which first low concentration impurity diffusion layers and dot-shaped second high concentration impurity diffusion layers 45 are arranged in parallel to the gate electrode 3 at a plurality of positions, an interlayer insulating film 9a having dot-shaped contact holes 53 arranged inside by given intervals from the respective dot-shaped peripheries on the second high concentration impurity diffusion layers 45, metal wiring for the drain formed on the interlayer insulating film 9a while burying the dot-shaped contact holes 53 therein in the drain region, and a source region composed of a third impurity diffusion layer 41. COPYRIGHT: (C)2004,JPO
申请公布号 JP2004079800(A) 申请公布日期 2004.03.11
申请号 JP20020238422 申请日期 2002.08.19
申请人 MITSUBISHI ELECTRIC CORP 发明人 SUGAHARA KAZUYUKI
分类号 H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L29/78
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