发明名称 |
Method and apparatus for improving testability of I/O driver/receivers |
摘要 |
An embodiment of this invention provides a circuit and method for improving the testability of I/O driver/receivers. First, two separate I/O driver/receiver pads are electrically connected. A bit pattern generator in one of the I/O driver/receivers drives a bit pattern through a driver to the connected pads. The bit pattern is then driven through the receiver of a second I/O driver/receiver to a first clocked register. An identical bit pattern generator in the second I/O driver/receiver then drives an identical bit pattern into a second clocked register. A comparator compares the outputs of these two registers. If the two bit patterns don't match, the comparator signals there is a functional problem with one of the I/O driver/receivers. |
申请公布号 |
US2004049721(A1) |
申请公布日期 |
2004.03.11 |
申请号 |
US20020238570 |
申请日期 |
2002.09.09 |
申请人 |
LAAKE KEVIN;GHISIAWAN NAVIN;ARNOLD BARRY J. |
发明人 |
LAAKE KEVIN;GHISIAWAN NAVIN;ARNOLD BARRY J. |
分类号 |
G01R31/317;G01R31/3185;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/317 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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