发明名称 Wafer chuck for producing an inert gas blanket and method for using
摘要 A wafer chuck for use in a semiconductor process chamber capable of producing an inert gas blanket positioned on the chuck from residual chemical vapor in the chamber is disclosed. A plurality of mounting pins for supporting a wafer is further provided in the upper surface for forming an inert gas into a cavity formed between the wafer and the upper surface of the chuck. A plurality of apertures in a sidewall of the body portion for flowing an inert gas into the lower chamber forming an inert gas blanket blocking a passageway between the upper and lower chambers, thus preventing the wafer from damage by residual chemical vapor in the lower chamber.
申请公布号 US6702900(B2) 申请公布日期 2004.03.09
申请号 US20010815216 申请日期 2001.03.22
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 YEH SU-YU;YANG HUAI-TEI;PAN CHENG-YANG;LAI JUN-YANG
分类号 H01L21/00;(IPC1-7):C23C16/00;C23F1/00;H01L21/306 主分类号 H01L21/00
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