发明名称 Semiconductor device having serially connected memory cell transistors provided between two current terminals
摘要 A semiconductor device exhibits a stable driving force and high performance reliability. The semiconductor device has at least one transistor having a gate insulating film formed on a element region in a semiconductor substrate, a gate electrode formed on the gate insulating film, and a diffused layer in element regions on both sides of the gate electrode. The device also has a barrier insulating film formed so as to cover the transistor and the diffused layer. The height from a surface of the semiconductor substrate to the barrier insulating film is greater than the height from the surface, of the interface between the gate insulating film and the gate electrode.
申请公布号 US6703669(B1) 申请公布日期 2004.03.09
申请号 US20000714228 申请日期 2000.11.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 GODA AKIRA;SHIMIZU KAZUHIRO;SHIROTA RIICHIRO;ARAI NORIHISA;KOIDO NAOKI;ARITOME SEIICHI;MARUYAMA TOHRU;HAZAMA HIROAKI;IIZUKA HIROHISA
分类号 G11C16/04;H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 G11C16/04
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