发明名称 Non-invasive brain function examination
摘要 An apparatus for examining a subject's brain functions acquires two or more indexes of pupillary indexes that show the subject's pupillary characteristics, visual indexes that show the subject's visual system functions, intelligence evaluating indexes that are results of the an intelligence test carried out on the subject, and behavior evaluating indexes that show the results the subject's behavior examination. Two or more indexes are stored in a memory and outputted from an output unit. By combining two or more kinds of independent indexes, accurate determination of dementia cases and further the degree of senescence of brain functions can be achieved. In addition, the brain function examining apparatus puts together a number of a plurality of indexes by the multivariate calculation and converts the indexes into different values of fewer numbers.
申请公布号 US6702757(B2) 申请公布日期 2004.03.09
申请号 US20010026646 申请日期 2001.12.27
申请人 MATSUSHITA ELECTRIC WORKS, LTD. 发明人 FUKUSHIMA SHOGO;MURAKAMI SHUJI;SUZUKI KENSHI;NAKAJIMA RYOJI
分类号 A61B3/06;A61B3/08;A61B3/11;A61B3/113;A61B5/00;A61B5/16;(IPC1-7):A61B13/00 主分类号 A61B3/06
代理机构 代理人
主权项
地址