发明名称 TRANSFER OF A THIN LAYER FROM A WAFER COMPRISING A BUFFER LAYER
摘要 Method of producing a structure comprising a thin layer of semiconductor material obtained from a wafer (10), the wafer (10) comprising a lattice parameter matching layer (2) comprising an upper layer of semiconductor material having a first lattice parameter, a film (3) of semiconductor material which has a nominal lattice parameter substantially different from the first lattice parameter and is strained by the matching layer (2), a relaxed layer (4) having a nominal lattice parameter substantially identical to the first lattice parameter, the metod comprising transfer of the relaxed layer (4) and the strained film (3) to a receiving substrate (5). Structures produced according to one of the processes according to the invention.
申请公布号 WO2004006311(A3) 申请公布日期 2004.03.04
申请号 WO2003IB03497 申请日期 2003.07.09
申请人 S.O.I.TEC SILICON ON INSULATOR TECHNOLOGIES;GHYSELEN, BRUNO;AULNETTE, CECILE;OSTERNAUD, BENEDICTE 发明人 GHYSELEN, BRUNO;AULNETTE, CECILE;OSTERNAUD, BENEDICTE
分类号 H01L21/02;H01L21/20;H01L21/762;H01L27/12 主分类号 H01L21/02
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