发明名称 Combination etch stop and in situ resistor in a magnetoresistive memory and methods for fabricating same
摘要 The invention relates to magnetic memory elements and methods for forming the same. A magnetic memory element includes an etch stop layer disposed between a lower electrode and a magnetoresistive cell body or stack. The etch stop layer advantageously protects the lower electrode during patterning of the magnetoresistive cell body. The etch stop layer can be patterned with patterning of the magnetoresistive cell body. The etch stop layer can be formed from conductive materials or from resistive materials. When the etch stop layer is formed from resistive materials, the etch stop layer forms an in situ resistor that can isolate a failed memory cell from other memory cells in a corresponding array of cells, such as in an MRAM. This permits the MRAM to continue to utilize other magnetoresistive cells that are coupled to the electrodes in the event of a failure of the magnetoresistive cell.
申请公布号 US2004042261(A1) 申请公布日期 2004.03.04
申请号 US20020231803 申请日期 2002.08.29
申请人 MICRON TECHNOLOGY, INC. 发明人 TUTTLE MARK E.
分类号 G11C11/15;H01F41/30;H01L21/8246;H01L27/22;H01L43/12;(IPC1-7):G11C11/15 主分类号 G11C11/15
代理机构 代理人
主权项
地址