发明名称 Lapping monitor for monitoring the lapping of transducers
摘要 A lapping monitor for monitoring the lapping of a lapping surface of a body having at least one transducer which has a height that has to be lapped. The lapping monitor has a lap unit for lapping the lapping surface, at least one lapping indicator mounted close to the transducer to indicate the height of the transducer and a control block in the body at a certain distance from the lapping indicator or indicators. It is also possible to use a property of the transducers themselves, e.g., their resistance, to indicate their height. The control block receives indication of the height of the transducers being lapped from the lapping indicators or from the transducers via an electrical connection. The control block is further equipped with test contacts for establishing an external connection. The lapping monitor is particularly well-suited for performing 4-point resistance tests of the lapping indicators or transducers and can be effectively employed in lapping rows of magnetoresistive transducers such as MR or GMR heads to accurate heights.
申请公布号 US6699102(B2) 申请公布日期 2004.03.02
申请号 US20010759830 申请日期 2001.01.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 REILEY TIMOTHY CLARK;ALBRECHT THOMAS ROBERT
分类号 B24B37/04;B24B49/10;G11B5/187;G11B5/31;G11B5/39;(IPC1-7):B24B49/00 主分类号 B24B37/04
代理机构 代理人
主权项
地址