| 摘要 |
PROBLEM TO BE SOLVED: To provide a reconstructed method for inputs to an device under test. SOLUTION: The inputs to the devices under test (DUT) 28, 38 are reconstructed. A data impressed to pins of the DUTs 28, 38 as stimulus is prepared in every trigger cycle of an inspection device 17. Response information obtained from the DUTs 28, 38 during the trigger cycle is used to constitute formating information for regulating a stimulus data value. Reconstruction information sufficient for the reconstruction of the stimulus data is stored. The reconstruction information includes the formating information. The reconstruction information is used for reconstruction of the stimulus data impressed to the pins of the DUTs 28, 38. COPYRIGHT: (C)2004,JPO
|
