发明名称 |
CHAMBER DOOR SYSTEM FOR PREVENTING WAFER FROM BEING BROKEN IN SEMICONDUCTOR FABRICATING EQUIPMENT |
摘要 |
PURPOSE: A chamber door system for preventing a wafer from being broken in semiconductor fabricating equipment is provided to prevent the wafer caught in a chamber door from being broken when the door is shut by precisely detecting the position of the wafer when the wafer is loaded/unloaded into/from a process chamber and by connecting the operation of the door to a detected signal. CONSTITUTION: A sensor unit detects the position of the wafer loaded into the process chamber(10). The door which opens and shuts the chamber shuts the door after the sensor unit detects that the wafer is in a normal position.
|
申请公布号 |
KR20040016506(A) |
申请公布日期 |
2004.02.25 |
申请号 |
KR20020048711 |
申请日期 |
2002.08.17 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
YOON, JONG CHEOL |
分类号 |
H01L21/02;(IPC1-7):H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|