HANDLER SYSTEM FOR TESTING SEMICONDUCTOR DEVICE

摘要

PURPOSE: A handler system for testing a semiconductor device is provided to reduce an area of a test unit and the loading or unloading area of the test unit by forming a structure of a test site with an oblique line and exposing only a part of the test unit of loading the semiconductor device. CONSTITUTION: A handler system for testing a semiconductor device includes a plurality of test units(T1-Tn), a rail(12), and a picker(14). The test units are installed toward an oblique line. The rail(12) is installed toward top sides of the test units(T1-Tn) in order to move the picker(14). The semiconductor device is loaded or unloaded on the test unit by the picker(14). The semiconductor device is loaded only on an exposed part of the test unit.