发明名称 Memory cell with vertical transistor and trench capacitor
摘要 A memory cell with a vertical transistor and a trench capacitor. The memory cell includes a substrate having a trench and a trench capacitor disposed in the lower trench. A control gate, with a p-type polysilicon germanium layer and an overlying p-type polysilicon layer, is disposed in the upper trench and insulated from the substrate. A first insulating layer is disposed between the trench capacitor and the control gate. A first doped region is formed in the substrate around the first insulating layer and a second doped region is formed in the substrate around the second conductive layer.
申请公布号 US6696717(B2) 申请公布日期 2004.02.24
申请号 US20020299431 申请日期 2002.11.18
申请人 NANYA TECHNOLOGY CORPORATION 发明人 CHANG MING CHENG;LIN JENG-PING
分类号 H01L21/8242;(IPC1-7):H01L29/72 主分类号 H01L21/8242
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