| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid-state imaging element which can reduce deterioration of image quality, particularly deterioration of the image quality at the edge portion of substrate and assure high accuracy read images. SOLUTION: A frame type field oxide film 4 is formed to a concave area R to surround the effective imaging region 1A of the solid-state imaging element. Accordingly, this surface is located so as to be at approximately the same level as the surface level of a photosensor 2. COPYRIGHT: (C)2004,JPO
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