发明名称 DRESSING METHOD, DRESSING APPARATUS, AND POLISHING APPARATUS FOR POLISHING TOOL
摘要 <P>PROBLEM TO BE SOLVED: To provide a dressing method, a dressing apparatus, and a polishing apparatus for a polishing tool, by which unevenness having an appropriate magnitude is easily formed on the surface of the polishing tool for chemical-mechanical polishing (CMP), and the life of the dressing apparatus is lengthened. <P>SOLUTION: The unevenness is formed by dressing the surface of the fixed grain polishing tool 10 of the polishing apparatus by means of the dressing apparatus 20. The dressing apparatus 20 is composed of a laser machining means for forming the unevenness by irradiating the surface of the fixed grain polishing tool 10 with a laser beam L. Besides the laser machining means, the dressing apparatus 20 may be composed of a blasting means for forming the unevenness by spraying minute particles on the surface of the fixed grain polishing tool or a stamping means for transferring the uneven shape provided on the surface of the stamp to the surface of the fixed grain polishing tool 10 by pushing the uneven shape provided on the surface of the stamp against the the surface of the fixed grain polishing tool 10. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004034159(A) 申请公布日期 2004.02.05
申请号 JP20020190122 申请日期 2002.06.28
申请人 EBARA CORP 发明人 FUKUDA AKIRA;HIYAMA HIROKUNI;KODERA AKIRA;HIROKAWA KAZUTO;AKATSUKA TOMOHIKO;SASAKI TATSUYA
分类号 B24B53/00;B24B53/017;H01L21/304 主分类号 B24B53/00
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