发明名称 LAYER SHORT-CIRCUITING INSPECTING APPARATUS AND LAYER SHORT-CIRCUITING INSPECTING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a layer short-circuiting inspecting apparatus and a layer short-circuiting inspecting method that can easily determine the presence or absence of layer short-circuiting and specify a place where the layer short-circuiting occurs. <P>SOLUTION: Rotary magnetic poles 3 are oppositely arranged inside a stator 50 gripped by a gripping means 11 of a base 1, and are rotated by a motor 2 for generating voltage in a coil of the stator 5. A voltage waveform detected by a voltage detector 42 is related with a magnetic pole position detected by a rotary detector 43 for processing, thus specifying the place where the layer short-circuiting occurs. <P>COPYRIGHT: (C)2004,JPO
申请公布号 JP2004037157(A) 申请公布日期 2004.02.05
申请号 JP20020192044 申请日期 2002.07.01
申请人 DENSO CORP 发明人 TAKEBAYASHI KAZUTOYO
分类号 G01R31/06;G01R31/34;H02K11/00 主分类号 G01R31/06
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