发明名称 Processing apparatus, measuring apparatus, and device manufacturing method
摘要 A processing apparatus includes a sealed vacuum chamber which contains a processing portion; a pressure controlling system which keeps the internal pressure of the sealed vacuum chamber constant at a predetermined level by exhausting the ambient gas in the sealed vacuum chamber; and an ambient gas recirculating system which recirculates the ambient gas exhausted from the sealed vacuum chamber back into the sealed vacuum chamber; wherein the ambient as recirculated by the ambient gas recirculating system is blown into the sealed vacuum chamber so that a gas flow is generated in a predetermined direction along the processing portion.
申请公布号 US2004022694(A1) 申请公布日期 2004.02.05
申请号 US20030619506 申请日期 2003.07.16
申请人 CANON KABUSHIKI KAISHA 发明人 HARA SHINICHI;TANAKA YUTAKA;TERASHIMA SHIGERU;HASEGAWA TAKAYUKI;MATSUI SHIN
分类号 H01L21/027;G03F7/20;G05D16/00;G05D16/20;(IPC1-7):G05D16/00;G05D23/00;H01L21/30 主分类号 H01L21/027
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