发明名称 Cleaning agent and cleaning process using the same
摘要 A cleaning agent which comprises 0.1 to 60% by weight of an oxidizing agent and 0.0001 to 5% by weight of a chelating agent. In the process for producing semiconductor integrated circuits, a pattern layer of a photoresist used as an etching mask and residues formed from the photoresist by dry etching can be easily removed with the cleaning agent. In the process for producing substrates for liquid crystal display panels, residues derived from a conductive thin film formed by dry etching can also be easily removed. In the cleaning processes using the cleaning agent, wiring materials or insulating materials in thin film circuit devices or other materials used for producing substrates of semiconductor integrated circuits and liquid crystal panels are not corroded.
申请公布号 US6686322(B1) 申请公布日期 2004.02.03
申请号 US20000581118 申请日期 2000.08.28
申请人 SHARP KABUSHIKI KAISHA;MITSUBISHI GAS CHEMICAL COMPANY, INC. 发明人 NOHARA MASAHIRO;HASHIMOTO RYOU;OKETANI TAIMI;ABE HISAKI;MARUYAMA TAKETO;AOYAMA TETSUO
分类号 C03C23/00;C11D3/39;C11D7/08;C11D7/32;C11D7/36;C11D11/00;C23G1/24;G02F1/1343;G03F7/42;H01L21/02;H01L21/027;H01L21/311;H01L21/3213;(IPC1-7):C11D9/42;C11D7/18 主分类号 C03C23/00
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