发明名称 CRYSTALLIZATION EQUIPMENT, CRYSTALLIZATION METHOD, THIN FILM TRANSISTOR, AND DISPLAY DEVICE
摘要 <p>PURPOSE: A crystallization apparatus, a crystallization method, a thin film transistor and a display apparatus are provided to realize sufficient lateral growth from a crystal nucleus and to produce a crystallized semiconductor film with a large particle size. CONSTITUTION: A crystallization apparatus includes an illumination system(2) that illuminates a phase shift mask(4) to irradiate a polycrystalline semiconductor film or an amorphous semiconductor film with a light beam that has a light intensity distribution of an inverse peak pattern that has a minimum light intensity in an area corresponding to a phase shift portion of the phase shift mask to produce a crystallized semiconductor film. The crystallization apparatus comprises an optical member to form on a predetermined plane a light intensity distribution of a concave pattern, which has a light intensity that is minimum in an area corresponding to the phase shift portion and increases toward a circumference of that area based on the light from the illumination system, and an image-forming optical system(3,5) to set a surface of the polycrystalline semiconductor film or the amorphous semiconductor film or its conjugate plane and the predetermined plane to an optical conjugate relationship.</p>
申请公布号 KR20040010337(A) 申请公布日期 2004.01.31
申请号 KR20030050437 申请日期 2003.07.23
申请人 ADVANCED LCD TECHNOLOGIES DEVELOPMENT CENTER CO.,LTD. 发明人 TANIGUCHI YUKIO;MATSUMURA MASAKIYO;YAMAGUCHI HIROTAKA;NISHITANI MIKIHIKO;TSUJIKAWA SUSUMU;KIMURA YOSHINOBU;JYUMONJI MASAYUKI
分类号 H01L29/786;B23K26/06;B23K26/067;B23K26/073;C30B1/00;G02F1/136;G03F1/26;G03F9/00;H01L21/00;H01L21/20;H01L21/324;H01L21/77;(IPC1-7):H01L29/786 主分类号 H01L29/786
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