发明名称 TEMPERATURE SENSING CIRCUIT
摘要 PURPOSE: A temperature sensing circuit is provided, which selects an optimum detector among a number of detectors by predicting delay variation within a variable range according to process variables or voltage variation. CONSTITUTION: A pulse generator(100) generates a pulse signal according to a temperature sensing signal. The fourth delay circuit(200) generates a number of delay signals by delaying the above temperature sensing signal with different delay time. The fifth delay circuit(300) delays the above temperature sensing signal. A number of detectors(401,402,403,404) compare the delay signals of the fourth delay circuit with the delay signal of the fifth delay circuit and then output the comparison value according to the pulse signal. A number of pads(701,702,703,704) read the output of the detectors. And a detector outputs an optimum temperature value by comparing the temperature value read through the pads with the present temperature value.
申请公布号 KR20040008540(A) 申请公布日期 2004.01.31
申请号 KR20020042179 申请日期 2002.07.18
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, SAENG HWAN
分类号 G01K1/02;G01K7/42;G01K15/00;G11C7/04;(IPC1-7):G11C29/00 主分类号 G01K1/02
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