Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials, and related procedure

摘要

Interferometric system for the simultaneous measurement of the index of refraction and of the thickness of transparent materials in a single measurement operation. The said system employs an interferometer as a "shear interferometer" having the advantage of varying the wavelength of the luminous source. <??>The invention is pertinent to the technical field of optics and to the technical field of characterization of materials and manufacturing of optical instruments. <IMAGE>