发明名称 |
Method and apparatus for providing rotational burn-in stress testing |
摘要 |
A method and device are provided for stress testing a chip. The chip may be partitioned into at least a first block and a second block. Burn-in stress testing may be performed on electronic devices within the first block without simultaneously performing burn-in stress testing on electronic devices within the second block. A burn-in stress testing device may perform the burn-in testing. A control device may be coupled to the burn-in stress testing device to enable burn-in stress testing on electronic devices within at least the first block of the chip without simultaneously enabling burn-in stress testing on the second block of the chip.
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申请公布号 |
US6683467(B1) |
申请公布日期 |
2004.01.27 |
申请号 |
US20000672689 |
申请日期 |
2000.09.29 |
申请人 |
INTEL CORPORATION |
发明人 |
KESHAVARZI ALI;WU DAVID M.;YE YIBIN;DE VIVEK K. |
分类号 |
G01R31/28;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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